Electron spectroscopy

Results: 1215



#Item
241Condensed matter physics / Photoemission spectroscopy / Electron / Angle-resolved photoemission spectroscopy / Chemisorption / Physics / Emission spectroscopy / Chemistry

Surface and Interface 3B/1998G011 Photoemission study of a possibility of forming small metal clusters : II. Ni on TiO2(001)

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:30:10
242Science / Crystallography / Spectroscopy / Reflection high-energy electron diffraction / X-ray / Diffraction topography / Diffraction / Scientific method / Physics

Photon Factory Activity Report 2006 #24 Part BSurface and Interface 4C,9C/2005G126 Friction of Ag/Sistudied by synchrotron X-ray diffraction

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:33:38
243Spintronics / Leptons / Spectroscopy / Inorganic compounds / Indium phosphide / Thermally stimulated current spectroscopy / Electron / Positronium / Positron / Chemistry / Physics / Quantum electrodynamics

Semicond. Sci. Technol–277. Printed in the UK PII: S0268Vacancies and negative ions in as-grown and ion-bombarded

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Source URL: www.geocities.jp

Language: English - Date: 2003-02-11 04:17:17
244Spectroscopy / Radiography / Condensed matter physics / Crystallography / Electron microscopy / X-ray / Electron / Focused ion beam / Anomalous X-ray scattering / Scientific method / Science / Physics

11 Instrumentation and Methodology 11-1 X - R a y P h a s e - C o n t r a s t Imaging Using an X-Ray HARP Camera (a-Se) photoconductive target and is characterized by

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:33:17
245Spectroscopy / Absorption spectroscopy / X-ray / Photon / Physics / Chemistry / Science

Photon Factory Activity Report 2007 #25 Part BSurface and Interface 7A, 11A/2004G009 Electron correlation effects in Co nano-islands

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:34:50
246Spectroscopy / Condensed matter physics / Environmental chemistry / Materials science / Microscopes / Photoemission electron microscopy / XANES / X-ray / Extended X-ray absorption fine structure / Scientific method / Science / Physics

Photon Factory Activity Report 2006 #24 Part BSurface and Interface 27A/2006G310 Chemical-state mapping by photoelectron emission microscopy using soft X-rays

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:33:40
247Electronic engineering / Semiconductor device fabrication / Atomic physics / Electromagnetism / Photoemission spectroscopy / High-k dielectric / Titanium nitride / Spectroscopy / Core electron / Physics / Chemistry / Emission spectroscopy

Photon Factory Activity Report 2010 #28 Part BSurface and Interface 2C/2008S2-003 Effect of nitrogen bonding states on dipole at the HfSiO/SiON interface studied by

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Source URL: pfwww.kek.jp

Language: English - Date: 2012-01-30 04:32:45
248Atomic physics / Spectroscopy / Surface chemistry / Molecular physics / X-ray photoelectron spectroscopy / Photoelectron photoion coincidence spectroscopy / Core electron / Chemistry / Physics / Physical chemistry

Photon Factory Activity Report 2008 #26 Part BSurface and Interface 1C/2006S2-002 Development of an Apparatus for High-Resolution Auger Photoelectron

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:36:03
249Condensed matter physics / Environmental chemistry / Materials science / Crystallography / Protein structure / Photoemission electron microscopy / XANES / Extended X-ray absorption fine structure / Photoemission spectroscopy / Scientific method / Science / Chemistry

1A Y.Wakabayashi, H.Sawa, M.Nakamura, M.Izumi and K.Miyano Lack of Influence of Anisotropic Electron Clouds on Resonant X-Ray Scattering from Manganite Thin Films

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:31:44
250Spectroscopy / Atomic physics / Surface chemistry / Molecular physics / X-ray photoelectron spectroscopy / Photoemission spectroscopy / Auger electron spectroscopy / Auger effect / Electron spectroscopy / Scientific method / Science / Physics

Photon Factory Activity Report 2010 #28 Part BSurface and Interface 1C/2006S2-002 Topmost-Surface-Sensitive Si-2p Photoelectron Spectra of Clean Si×1 Measured with Photoelectron Auger Coincidence Spectros

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Source URL: pfwww.kek.jp

Language: English - Date: 2012-01-30 04:32:45
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